IGBT tail current reduction by current injection technique

Eio, S. and SHAMMAS, Noel (2008) IGBT tail current reduction by current injection technique. In: Universities Power Engineering Conference, 2008. UPEC 2008. 43rd International, 1-4 Sept. 2008, Padova.

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Abstract or description

In this paper, experiments where current was injected into an IGBT (insulated gated bipolar transistor) during its turn-off transient were carried out. Results showed a significant reduction in the IGBTpsilas collector tail current which could increase the operating frequency for an application. These experiment includes a switching transient test circuit to simulate the collector tail currents, and the implementation of a current injection circuit (CIC) and a non-invasive current injection circuit (NICIC) into the experiments to reduce the collector tail current.

Item Type:	Conference or Workshop Item (Paper)
Uncontrolled Keywords:	Bipolar transistors;Charge carrier lifetime;Circuit testing;Gold;Impurities;Insulated gate bipolar transistors;Insulation;Platinum;Tail;Voltage;insulated gate bipolar transistors;IGBT tail current reduction;collector tail current reduction;insulated gated bipolar transistor;non-invasive current injection circuit;switching transient test circuit;turn-off transient;
Faculty:	Previous Faculty of Computing, Engineering and Sciences > Engineering
Event Title:	Universities Power Engineering Conference, 2008. UPEC 2008. 43rd International
Event Location:	Padova
Event Dates:	1-4 Sept. 2008
Depositing User:	Rakesh YEDLA
Date Deposited:	28 Jan 2013 15:15
Last Modified:	24 Feb 2023 03:46
URI:	https://eprints.staffs.ac.uk/id/eprint/415

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